EUV Insight

Terms of use

Effective 2026-09-15

Agreement

By using EUV Insight (the website and the application) you agree to these terms. If you do not agree, do not use the service.

License

You may use EUV Insight for your own engineering, research and educational work, including work for your employer. You may not resell the service, remove notices from exported material, or attempt to disrupt the site.

Results are engineering estimates

EUV Insight computes optical performance using standard thin-film models and either bundled reference tables or optical constants you import. Bundled tables are published reference data, not measurements made by EUV Insight. Coverage and model assumptions vary by material; an imported dataset applies only within its supplied range. Results are estimates for design and evaluation. Verify them independently before making manufacturing, procurement or safety decisions.

Reference data and acknowledgment

Bundled reference tables are sourced from the Center for X-Ray Optics (CXRO) at Lawrence Berkeley National Laboratory, drawing on the work of B. L. Henke, Eric M. Gullikson, J. C. Davis and subsequent contributors. See Data and methodology for the scientific reference and source links. EUV Insight is an independent application; source attribution does not imply endorsement by the named researchers or institutions.

No warranty

The service is provided "as is" and "as available", without warranty of any kind, express or implied, including fitness for a particular purpose. To the fullest extent permitted by law, we are not liable for any loss or damage arising from use of the service or reliance on its results.

Changes

We may update these terms. The effective date above changes when we do. Continued use after a change means you accept the new terms.

Contact

Use our contact form or open Contact in the app’s Settings panel.