About EUV Insight

EUV Insight is an independent application for exploring EUV thin-film filters and multilayer optics. It connects layer-stack inputs with spectra, design comparisons and manufacturing analysis.

Built around engineering questions

What changes when a film is thicker? How does a mirror respond at a different angle? How sensitive is a candidate to thickness errors? Public calculators and worked examples help you explore those questions before continuing in the workspace.

Transparent assumptions

Useful results need context. Our methods page explains the calculation, reference data, numerical checks and limitations. Source credit does not imply that a contributor or institution endorses this application.

Help shape the application

Send a question, feature request or bug report. Describe the engineering task and the outcome you need.