Mo/Si multilayer reflectivity calculator
Explore how bilayer count, period and absorber fraction affect a Mo/Si mirror. Calculate reflectivity and peak wavelength near 13.5 nm.
Public demonstration. Opening and editing the full repeated stack in the workspace requires Pro. The free workspace remains limited to three film layers.
Explore a periodic mirror
Change the number of bilayers, period d and absorber fraction Γ. The plotted reflectivity and peak metrics update together. The period is the combined Mo-plus-Si thickness; Γ is the fraction occupied by Mo. For the default 6.9 nm period and Γ = 0.4, each period contains 2.76 nm Mo and 4.14 nm Si.
What the default model contains
All comparisons use 40 Mo/Si bilayers on silicon, a 6.9 nm period, and a molybdenum thickness fraction Γ of 0.4. The incident side starts with Si. Mo and Si densities are 10.22 and 2.33 g/cm³. The sweep covers 12.4–14.6 nm in 0.01 nm steps with unpolarized illumination. Angles are measured from the surface normal.
The default calculation uses smooth interfaces and normal incidence. Real mirrors can contain interlayers, contamination, thickness drift and roughness. Agreement with this idealized model is not evidence that a fabrication process will achieve the same result.
How should I read the peak metrics?
Peak reflectivity is the largest sampled value within the wavelength range. Peak wavelength and full width at half maximum describe that sampled band. If the peak moves outside the range, widen the workspace sweep before drawing a conclusion.
Next design questions
Explore incidence-angle dependence and interface roughness, then evaluate thickness variation in the Pro workspace.
Calculated examples use the bundled optical reference tables, not measured samples. Zr/Si/Mo example-data fingerprint: 92954053bf1c26ab. Assumptions and data sources.